Samsung Electronics and Nova Jointly awarded the Vladimir Ukraintsev Award at the SPIE Advanced Lithography conference
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Nova and Samsung Electronics have been awarded the Vladimir Ukraintsev Award for their collaborative paper on metrology techniques at the SPIE Advanced Lithography conference.
March 18, 2025 | 12:15 pm
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Nova, in collaboration with Samsung Electronics, received the Vladimir Ukraintsev Award for their paper on metrology techniques, highlighting their innovation and expertise in the field.
The award recognition for Nova's collaborative work with Samsung highlights their innovation and expertise in metrology, which could positively influence investor perception and potentially boost the stock price.
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